Frozen in time: a new method using cryo-scanning electron microscopy to visualize root-fungal interactions

Steve Refshauge1, Michelle Watt, Margaret E McCully

  • 1CSIRO Plant Industry, GPO Box 1600, Canberra, ACT 2601, Australia.

The New Phytologist
|September 26, 2006
PubMed
Summary

A novel cryo-scanning electron microscopy method reveals intact fungal invasion in wheat roots. This technique preserves plant and fungal structures in three dimensions, offering a clearer view of diseases caused by necrotrophic fungi.