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Updated: Jul 19, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
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Single-shot spectrometry for x-ray free-electron lasers

Makina Yabashi1, Jerome B Hastings, Max S Zolotorev

  • 1SPring-8/JASRI, Kouto 1-1-1, Sayo, Hyogo 679-5198, Japan. yabashi@spring8.or.jp

Physical Review Letters
|October 10, 2006
PubMed
Summary

A new single-shot spectrometer using a mirror and crystal measures X-ray Free-Electron Laser (XFEL) pulse widths from sub-femtoseconds to picoseconds with high resolution.

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