Microstructural characterization of nitrided Timetal 834

The microstructure of Timetal 834, in as-received condition and after nitriding under glow discharge has been examined by light microscopy and analytical transmission electorn microscopy (TEM) methods (SAED, EDS, EELS and EFTEM). The microstructure of the as-received alloy consists of the alpha phase and a small amount of the beta phase. Silicide precipitates (Zr5Si4) are present both inside the grains and at the grain boundaries. TEM investigations of cross-sectional thin foils allow for detailed analysis of the nitrided layer microstructure. It was found that the nitrided layer exhibits a graded character with continuously varying nitrogen content. The outermost sublayer consists of nanocrystals of delta-TiN. The following sublayers consist mainly of delta'-Ti2N and epsilon-Ti2N grains. The last sublayer, closest to the substrate, is identified as a nitrogen-rich alpha(N) solid solution containing up to 14 at% of nitrogen.