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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
O Casula1, C Poidevin, G Cattiaux
1Commissariat à l'Energie Atomique. CEA Saclay, Bat 611, 91191 Gif sur Yvette, France. olivier.casula@cea.fr <olivier.casula@cea.fr>
Flexible phased array transducers adapt to complex shapes, overcoming limitations of wedge transducers for improved ultrasonic testing. This technology enhances flaw detection in components with irregular geometries.
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