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Updated: Jul 19, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Structural contributions to charge transport across Ni-octanedithiol multilayer junctions

Lam H Yu1, Christopher D Zangmeister, James G Kushmerick

  • 1National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.

Nano Letters
|November 9, 2006
PubMed

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