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Characterizing the reflectance near the Brewster angle: a Padé-approximant approach
Teresa Yonte1, Luis L Sánchez-Soto
1Departmento de Optica, Universidad Complutense, Madrid, Spain.
Abstract:
We characterize the reflectance peak near the Brewster angle for both an interface between two dielectric media and a single slab. To approach this problem analytically, we approximate the reflectance by a first-order diagonal Padé. In this way, we calculate the width and the skewness of the peak, and we show that although they present a well-resolved maximum they are otherwise not so markedly dependent on the refractive index. As an application of interest, we derive simple expressions for the precision of the Abelès Brewster-angle method.
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