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Updated: Jul 18, 2026

Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
Published on: April 25, 2019
Enhancing near-infrared avalanche photodiode performance by femtosecond laser microstructuring
Richard A Myers1, Richard Farrell, Arieh M Karger
1Radiation Monitoring Devices, Inc., 44 Hunt Street, Watertown, Massachusetts 02472-4699, USA. rmyers@rmdinc.com
Abstract:
A processing technique using femtosecond laser pulses to microstructure the surface of a silicon avalanche photodiode (APD) has been used to enhance its near-infrared (near-IR) response. Experiments were performed on a series of APDs and APD arrays using various structuring parameters and poststructuring annealing sequences. Following thermal annealing, we were able to fabricate APD arrays with quantum efficiencies as high as 58% at 1064 nm without degradation of their noise or gain performance. Experimental results provided evidence to suggest that the improvement in charge collection is a result of increased absorption in the near-IR.

