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Deep-ultraviolet Raman microspectroscopy: characterization of wide-gap semiconductors

Shin-ichi Nakashima1, Hazime Okumura, Taketsugu Yamamoto

  • 1National Institute of Advanced Science and Industrial Technology, Central 2, Umezono 1-1-1, Tsukuba, Ibaraki 305-8568 Japan. nakashima-s@aist.go.jp

Applied Spectroscopy
|December 5, 2006
PubMed

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