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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Cantilever dynamics and quality factor control in AC mode AFM height measurements

Liwei Chen1, Xuechun Yu, Dan Wang

  • 1Department of Chemistry and Biochemistry, Ohio University, Athens, OH 45701, USA. lwchen@helios.phy.ohiou.edu

Ultramicroscopy
|December 13, 2006
PubMed

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