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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

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A complete analysis of the laser beam deflection systems used in cantilever-based systems

L Y Beaulieu1, Michel Godin, Olivier Laroche

  • 1Department of Physics and Physical Oceanography, Memorial University. St. John's, NL., Canada A1B 3X7.

Ultramicroscopy
|December 19, 2006
PubMed

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