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Bonding and electronic structure of XeF3-
Ian H Krouse1, Changtong Hao, Catherine E Check
1Department of Chemistry and Biochemistry, Northern Illinois University, DeKalb, Illinois 60115, USA.
Journal of the American Chemical Society
|January 25, 2007
Summary
The xenon-fluoride bond dissociation energy in the XeF3- ion was measured at 0.84 eV. This value is higher than predicted, suggesting complex bonding interactions in this molecule.
Area of Science:
- Inorganic Chemistry
- Computational Chemistry
- Chemical Physics
Background:
- The structure and bonding of polyatomic anions like XeF3- are not fully understood.
- Existing models struggle to accurately predict the stability and dissociation energies of such species.
Purpose of the Study:
- To experimentally measure the xenon-fluoride bond dissociation energy in XeF3-.
- To elucidate the bonding characteristics and low-energy structures of XeF3- using theoretical approaches.
Main Methods:
- Energy-resolved collision-induced dissociation (CID) experiments were performed on XeF3-.
- Molecular orbital (MO) calculations, including diradical and orbital interaction models, were employed.
- Electronic structure calculations identified potential low-energy geometries.
Main Results:
- The measured Xe-F bond dissociation energy in XeF3- is 0.84 ± 0.06 eV.
- This experimental value exceeds predictions from electrostatic and three-center, four-electron bonding models.
- Two low-energy singlet structures (Y- and T-shaped) and a higher-energy triplet state were identified for XeF3-.
- Calculations favor the Y-shaped geometry as the most stable, with pseudorotation possible through the T-shaped structure.
Conclusions:
- The bonding in XeF3- is more complex than suggested by simpler models.
- Dissociation likely proceeds via rearrangement to the T-shaped structure before fluoride loss.
- Experimental and computational methods provide complementary insights into the stability and reactivity of XeF3-.
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