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Updated: Jul 17, 2026

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
Imaging and analysis of 3-D structure using a dual beam FIB
1Electron Microscope Unit, University of New South Wales, Sydney, New South Wales, Australia.
Abstract:
The application of focused ion beam instrumentation in the generation of three-dimensional microstructural data is described. The methodologies used to acquire and manipulate this data are explained, and the technique is illustrated by a number of examples from the material sciences. The limitations of this method, and practical pointers to the generation of meaningful data, are also discussed.
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