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Optical phase distribution evaluation by using an S-transform.

Serhat Ozder¹, Ozlem Kocahan, Emre Coşkun

¹Department of Physics, Canakkale Onsekiz Mart University, Turkey.

|February 20, 2007

Summary

This study explores using the S-transform to analyze 2D fringe patterns for phase distribution. The S-transform method shows promise for optical metrology applications.

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Area of Science:

Optical metrology
Signal processing
Image analysis

Background:

Phase distribution analysis is crucial for optical metrology.
Traditional methods like Fourier Transform Profilometry have limitations.
The S-transform offers potential for improved phase extraction.

Purpose of the Study:

To investigate the efficacy of the S-transform for evaluating phase distribution in 2D fringe patterns.
To introduce carrier frequencies in both spatial directions (x and y) for S-transform analysis.
To compare S-transform-based methods with Fourier Transform Profilometry.

Main Methods:

Experimental setup for capturing 2D fringe patterns.
Application of the S-transform, including S-transform gradient and S-transform phase methods.
Comparative analysis against the Fourier Transform Profilometry algorithm.

Main Results:

The S-transform successfully extracts phase distribution from 2D fringe patterns.
Demonstration of carrier frequency introduction in x and y directions.
Comparison highlights the performance of S-transform analysis relative to Fourier Transform Profilometry.

Conclusions:

The S-transform is a viable technique for phase distribution evaluation in optical fringe patterns.
S-transform-based methods offer an alternative to traditional profilometry algorithms.
Further research can explore advanced applications of S-transform in optical measurements.