Near-infrared thermography using a charge-coupled device camera: application to microsystems

Using near-infrared thermography microscopy and a low-cost charge-coupled device (CCD) camera, we have designed a system which is able to deliver quantitative submicronic thermal images. Using a theoretical model based on Planck's law and CCD sensor properties allowed us to determine a minimal theoretical detection temperature and an optimal temperature sensitivity of our system. In order to validate this method, we show a good relationship between a theoretical study and a thermal measurement of a microsample.