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Precision of NIDEK OPD-scan measurements
Mike P Holzer1, Susanne Goebels, Gerd U Auffarth
1International Vision Correction Research Centre (IVCRC), Department of Ophthalmology, Ruprecht-Karls-University of Heidelberg, Germany. mike.holzer@med.uni-heidelberg.de
Journal of Refractive Surgery (Thorofare, N.J. : 1995)
|April 21, 2007
Summary
The NIDEK OPD-Scan demonstrates good precision for wavefront measurements of total, corneal, and internal optical aberrations. This device offers reliable repeatability for evaluating higher-order aberrations like spherical aberration, coma, and trefoil.
Area of Science:
- Ophthalmology
- Optometry
- Optical Engineering
Background:
- Wavefront aberrations impact visual quality.
- Accurate measurement of these aberrations is crucial for diagnosing and managing visual dysfunction.
- The NIDEK OPD-Scan is a device used for wavefront analysis.
Purpose of the Study:
- To assess the repeatability of wavefront measurements obtained with the NIDEK OPD-Scan.
- To evaluate the precision of the device in measuring total, corneal, and internal optical aberrations.
Main Methods:
- 179 eyes from 90 healthy volunteers underwent four consecutive measurements using the NIDEK OPD-Scan.
- The device measured total, corneal, and internal wavefront errors via slit retinoscopy.
- Repeatability was assessed for spherical aberration, coma, and trefoil.
Main Results:
- The NIDEK OPD-Scan showed good repeatability for all evaluated higher-order aberrations.
- The best repeatability was observed for total aberrations, followed by internal and corneal aberrations.
Conclusions:
- The NIDEK OPD-Scan exhibits good precision for wavefront measurements.
- The device is reliable for assessing total, corneal, and internal optical aberrations.
