Related Experiment Video
Updated: Jul 15, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Design of multipulse Thomson scattering diagnostic for SST-1 tokamak
Ajai Kumar1, Chhaya Chavda, Y C Saxena
1Institute For Plasma Research, Bhat, Gandhinagar, India. ajai@ipr.res.in
Abstract:
A multipulse Nd:YAG (Yttrium aluminum garnet) Thomson scattering (TS) system is designed and developed for measuring electron temperature (T(e)) and density (n(e)) profiles of SST-1 tokamak. The system operates at vertical, divertor, and horizontal (midplane) regions of plasma and measures the electron temperature of 20 eV to 1.5 keV and density of 10(18)-10(19) m(-3). Six Nd:YAG lasers synchronized with external control is used to get three different temporal resolutions (30 Hz, 180 Hz, and 1 kHz). The entire system is laboratory tested for the stability of alignment and performance over a distance of 30 m. Different imaging lens assemblies are designed to image the scattered photons from each of the scattering region to an array of optical fibers. A low cost and compact five-channel interference filter polychromator is designed, fabricated, and tested for its image quality and the filter transmission characteristics. Detection system with an avalanche photodiode and required signal conditioning electronics is developed for detecting the scattered photons. A data acquisition and control module operating on PXI bus is developed for the real time data acquisition and system control. A detailed description of design and testing of TS subsystems is presented in this article.
Related Concept Videos
Thomson's e/m Experiment
A particle with charge q, speed v, and mass m enters an area from the top, where the magnetic and electric fields are perpendicular both to the particle's motion and to one another. The magnetic...
Tandem Mass Spectrometry
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

