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Updated: Aug 15, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Sub-nanosecond measurements of high-current and high-voltage pulses
Yan Zeltser1, Viktor Akhmetzianov2, Levi Schächter1
1Electrical Engineering Department, Technion - Israel Institute of Technology, Haifa 32000, Israel.
Abstract:
We present a measurement tool encompassing four different types of sensors: a B-dot, a D-dot, a capacitive voltage divider, and a low-inductance current-view resistor. The tool can measure high-voltage, high-current pulses with rise times <150 ps. A calibration procedure for the device using a commercial pulse generator is demonstrated. Measurements of pulses with <150 ps rise time generated by a spiral generator with sharpening spark gaps are also presented.
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