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EBSD image quality mapping.

Stuart I Wright1, Matthew M Nowell

  • 1EDAX-TSL, 392 East 12300 South, Draper, Utah 84020, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 8, 2007
PubMed
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Image quality maps from electron backscatter diffraction reveal microstructure details. Different metrics highlight specific features: conventional IQ excels at grain boundary and strain contrast, while intensity-based IQ better shows topography and phase.

Area of Science:

  • Materials Science
  • Crystallography
  • Microscopy

Background:

  • Electron backscatter diffraction (EBSD) generates image quality (IQ) maps for microstructure visualization.
  • IQ map contrast originates from diverse sources like phase, strain, topography, and grain boundaries.

Purpose of the Study:

  • To compare various IQ metrics for EBSD data.
  • To identify the primary contrast mechanism associated with each IQ metric.

Main Methods:

  • Construction and comparison of IQ maps using different IQ metrics from EBSD data.
  • Analysis of contrast mechanisms contributing to map visualization.

Main Results:

  • The conventional IQ metric demonstrated superior contrast for grain boundaries and strain.

Related Experiment Videos

  • An IQ metric based on average diffraction pattern intensity provided enhanced topological and phase contrast.

    • Conclusions:

    • The choice of IQ metric significantly influences the microstructure features visualized in EBSD maps.
    • Selecting appropriate IQ metrics is crucial for accurate interpretation of EBSD data and microstructure characterization.