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Updated: Jul 14, 2026

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
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Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis

Published on: March 29, 2016

Dynamics and hysteresis of the contact line between liquid hydrogen and cesium substrates

E Rolley1, C Guthmann

  • 1Laboratoire de Physique Statistique de l'ENS, associé au CNRS et aux Universités Paris 6 et Paris 7, 24 rue Lhomond, 75005 Paris, France.

Physical Review Letters
|May 16, 2007
PubMed

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