Uncertainty evaluation for the spectroradiometric measurement of the averaged light-emitting diode intensity

Seongchong Park1, Dong-Hoon Lee, Yong-Wan Kim

  • 1Division of Physical Metrology, Korea Research Institute of Standards and Science, Doryong-dong 1, Yuseong-gu, Daejeon, South Korea. spark@kriss.re.kr

Applied Optics
|May 22, 2007
PubMed

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