Tightly focused epimicroscope technique for submicrometer-resolved highly sensitive refractive index measurement of

Youngchun Youk1, Dug Young Kim

  • 1Department of Information and Communication, Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Korea. ycyouk@gist.ac.kr

Applied Optics
|May 22, 2007
PubMed