Composition analysis of semiconductor quantum wells by energy filtered convergent-beam electron diffraction

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

D Jacob1, J M Zuo, A Lefebvre

  • 1Université des Sciences et Technologies de Lille, Bâtiment C6, 59655 Villeneuve d'Ascq cedex, France. damien.jacob@univ-lille1.fr

Ultramicroscopy
|July 17, 2007
PubMed

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