A review of errors in multi-frequency EIT instrumentation

A McEwan1, G Cusick, D S Holder

  • 1Department of Medical Physics and Bioengineering, UCL, London, UK. a.mcewan@ucl.ac.uk

Summary

Multi-frequency electrical impedance tomography (MFEIT) shows promise for medical imaging but faces challenges. Addressing errors like stray capacitance is key for developing clinically accepted MFEIT systems.

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