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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis

J Hasegawa1, T Tada, Y Oguri

  • 1Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8550, Japan. jhasegaw@nr.titech.ac.jp

The Review of Scientific Instruments
|August 4, 2007
PubMed

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