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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Anomalous resistance ridges along filling factor nu=4i

K Takashina1, M Brun, T Ota

  • 1NTT Basic Research Laboratories, NTT Corporation, Atsugi-shi, Kanagawa 243-0198, Japan.

Physical Review Letters
|August 7, 2007
PubMed

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