Related Experiment Video
Updated: Jul 12, 2026
In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
In situ synchrotron far-infrared spectromicroscopy of a copper electrode at grazing incidence angle
F Hahn1, Y -L Mathis, A Bonnefont
1UMR 6503, CNRS, Université de Poitiers, 40 avenue du Recteur Pineau, F-86022 Poitiers, France.
Abstract:
Synchrotron far-infrared spectroscopy in situ was successfully carried out on a copper microelectrode using a grazing-angle objective attached to a Bruker IRscope II microscope. The thin-layer spectroelectrochemical cell was constructed out of Teflon and fitted with a 20 microm-thick Mylar window; the copper electrode was 500 microm in diameter. Measurements were carried out in 0.1 M NaOH solution as a function of applied potential between -1.4 and 0 V versus a Hg/Hg2SO(4) reference electrode. Results demonstrate that with the present technique it is possible to obtain in situ spectra with excellent signal-to-noise ratio for surface oxide films formed electrochemically with less than 1 nL of active solution volume. The surface film on copper at 0 V consisted mainly of CuO with possibly some Cu(OH)2 also present. This interpretation is consistent with previous works and thermodynamic calculations.
