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X-ray Diffraction Studies on Tin at High Pressure and High Temperature
Science (New York, N.Y.)
|September 13, 1963
Summary
Tin exhibits tetragonal symmetry at high pressure (39 kb) and temperature (314°C). Researchers mapped the tin I and tin II phase boundary up to 70 kb using X-ray diffraction.
Area of Science:
- Materials Science
- Solid-State Physics
- Crystallography
Background:
- Tin undergoes phase transitions under varying pressure and temperature conditions.
- Understanding the crystallographic structure of tin phases is crucial for materials science applications.
Purpose of the Study:
- To determine the crystallographic structure of tin at high pressure and temperature.
- To investigate the melting curve and phase boundary of tin.
- To characterize the tin I and tin II phase transition.
Main Methods:
- X-ray diffraction techniques were employed to analyze tin's structure.
- High-pressure experiments were conducted up to 70 kilobars (kb).
- Temperature was controlled at 314 degrees Celsius during structural analysis.
Main Results:
- Tin was observed to have tetragonal symmetry at 39 kb and 314°C.
- Unit cell dimensions were determined: a = 3.81 Å, c = 3.48 Å, with c/a = 0.91.
- The melting curve was observed up to 45 kb, and the tin I-tin II phase boundary was mapped to 70 kb.
Conclusions:
- The study provides precise crystallographic data for tin under specific high-pressure conditions.
- The phase diagram of tin was extended, clarifying the boundary between tin I and tin II phases.
- These findings contribute to the understanding of tin's behavior in extreme environments.
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