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Auger electron angular distributions from surfaces: direct comparison with isoenergetic photoelectrons
Science (New York, N.Y.)
|March 8, 1991
Summary
Comparing Auger electron and photoelectron angular distributions from copper (Cu) reveals significant differences. This finding indicates that Auger electron angular distributions require further study before reliably analyzing surface structures.
Area of Science:
- Surface Science
- Atomic Physics
- Condensed Matter Physics
Background:
- Auger electron spectroscopy and photoelectron spectroscopy are surface-sensitive techniques.
- Angular distribution measurements provide insights into electron emission processes.
Purpose of the Study:
- To compare the angular distribution patterns of Auger electrons and photoelectrons from a copper (Cu) (001) surface at identical kinetic energies.
- To assess the suitability of Auger electron angular distributions for surface structure analysis.
Main Methods:
- Simultaneous measurement of angular distributions for Auger electrons and photoelectrons.
- Utilizing a Cu (001) surface as the sample.
- Maintaining constant electron kinetic energy during measurements.
Main Results:
- Observed substantial differences in low kinetic energy angular distributions between Cu Auger electrons and Cu 3p(3/2) photoelectrons.
- Demonstrated that the Auger process can generate a complex source wave.
Conclusions:
- Direct comparison highlights discrepancies between photoelectron and Auger electron angular distributions.
- Further investigation into the nature of the Auger source wave is necessary for accurate surface structure determination using Auger electron angular distributions.
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