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Updated: Jul 10, 2026
Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force
1The Rowland Institute at Harvard, Harvard University, Cambridge, Massachusetts 02142, USA. sahin@rowland.harvard.edu
Abstract:
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.
