Demonstration of magnetoelectric scanning probe microscopy

Area of Science:

• Materials Science
• Physics
• Electrical Engineering

Background:

• Scanning probe microscopy is crucial for nanoscale imaging.
• High sensitivity magnetic field detection is essential for advanced characterization.
• Magnetoelectric sensors offer a promising route for sensitive magnetic field transduction.

Purpose of the Study:

• To develop a near-field scanning magnetic probe microscope operating at room temperature.
• To utilize a laminated magnetoelectric sensor for enhanced sensitivity.
• To demonstrate the imaging capability for small alternating currents.

Main Methods:

• Fabrication of a simple trilayer longitudinal-transverse mode magnetoelectric sensor using Metglas and polyvinylidene fluoride.
• Integration of the sensor into a scanning magnetic probe microscope.
• Characterization of the sensor's AC field sensitivity and imaging of a current-carrying ring.

Main Results:

• The magnetoelectric sensor exhibited an AC field sensitivity of 467+/-3 microV/Oe within the 200 Hz-8 kHz frequency range.
• The developed microscope successfully imaged a 2 mm diameter ring carrying an AC current as low as 10(-5) A.
• Detection of AC magnetic fields as small as 3 x 10(-10) T was achieved.

Conclusions:

• A functional room temperature near-field scanning magnetic probe microscope has been successfully developed.
• The laminated magnetoelectric sensor provides high sensitivity for detecting weak AC magnetic fields.
• This technology holds potential for nanoscale magnetic imaging and characterization applications.