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Implementation of a Reference Interferometer for Nanodetection

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Published on: April 26, 2014

White-light interferometry using a channeled spectrum. 2. Calibration methods, numerical and experimental results.

Chengxing Zhai¹, Mark H Milman, Martin W Regehr

¹Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109, USA. Chengxing.Zhai@jpl.nasa.gov

|November 13, 2007

Summary

This study calibrates key parameters for a white light interference model, improving astrometric observations. The new method refines algorithms for precise measurements using simulated and real interferometer data.

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Area of Science:

Optical Engineering
Interferometry
Astrometry

Background:

A prior study established a white light interference model using source and instrument transmission function moments.
Accurate calibration of these moment parameters and instrument dispersion is crucial for model application.

Purpose of the Study:

To develop and implement an end-to-end calibration process for moment parameters and differential dispersion.
To apply these calibrated parameters to existing white light interference algorithms for enhanced astrometric observations.

Main Methods:

Pixel-level monochromatic parameters (wavenumber, phase, intensity, visibility) are obtained using nonlinear least-squares fitting.
These pixel-level parameters are aggregated to determine global moment and dispersion parameters.
The calibration procedure is validated on simulated astrometric data and experimental results from the microarcsecond metrology testbed (MAM).

Main Results:

Successful calibration of moment parameters and differential dispersion was achieved.
The developed calibration process was effectively applied to both simulated and real interferometer data.
The refined model demonstrated improved accuracy for astrometric observations.

Conclusions:

The end-to-end calibration process enables accurate determination of essential parameters for white light interference models.
This methodology enhances the performance of astrometric algorithms, particularly in precision measurement applications.
The validated approach contributes to the advancement of interferometer technology for high-precision metrology.