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Updated: Jul 10, 2026

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)
Published on: October 2, 2012
Tunneling in frustrated total internal reflection: a comparison of different approaches
Anedio Ranfagni1, Paolo Moretti, Ilaria Cacciari
1Istituto di Fisica Applicata Nello Carrara del Consiglio Nazionale delle Ricerche, via Madonna del Piano 10, 50019 Sesto Fiorentino, Firenze, Italy.
Abstract:
Tunneling processes in frustrated total internal reflection are reexamined in order to compare the results already obtained from adopting a procedure based on a transition-element analysis with those recently reported on the basis of a statistical method applied to a Brownian-like motion. A close agreement between the two approaches can be established, at optical and microwave scales, when suitable values of the involved parameters are adopted.
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