Implantable stimulator failures: causes, outcomes, and solutions

Xiao Liu1, Andreas Demosthenous, Nick Donaldson

  • 1Department of Electronic and Electrical Engineering, University College London, London, WC1E 7JE, UK. x.liu@ee.ucl.ac.uk

Summary

This study addresses implantable stimulator failures by proposing a new Manchester non-return-to-zero code. This coding scheme enhances safety by preventing prolonged DC currents, protecting surrounding tissue during cable failures.

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