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Related Concept Videos

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In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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Related Experiment Video

Updated: Jul 10, 2026

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
11:27

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

Published on: December 8, 2016

Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution.

Peter John Rodrigo, May Lim, Caesar Saloma

    Optics Letters
    |November 17, 2007
    PubMed
    Summary

    This study demonstrates a new laser imaging system capable of detecting subwavelength movements and their directions in reflecting samples with high resolution. The technology offers precise measurements within the system's depth of field.

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    Related Experiment Videos

    Last Updated: Jul 10, 2026

    Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
    11:27

    Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

    Published on: December 8, 2016

    From Fast Fluorescence Imaging to Molecular Diffusion Law on Live Cell Membranes in a Commercial Microscope
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    From Fast Fluorescence Imaging to Molecular Diffusion Law on Live Cell Membranes in a Commercial Microscope

    Published on: October 9, 2014

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Semiconductor Lasers

    Background:

    • Accurate displacement measurements are crucial in various scientific and industrial applications.
    • Existing methods may lack the required resolution or directional sensitivity for subwavelength movements.
    • Optical feedback systems offer potential for enhanced measurement precision.

    Purpose of the Study:

    • To demonstrate direction-sensitive displacement measurements at diffraction-limited resolution.
    • To detect subwavelength axial movements and their directions within the depth of field.
    • To compare theoretical predictions with actual instrument performance.

    Main Methods:

    • Utilized an interferometric optical-feedback semiconductor laser confocal imaging system.
    • Employed laser-based interferometry for displacement sensing.
    • Focused on confocal imaging for high spatial resolution.

    Main Results:

    • Achieved direction-sensitive displacement measurements at diffraction-limited spatial resolution.
    • Successfully detected subwavelength axial movements of a reflecting sample.
    • Confirmed the ability to discern the direction of motion within the depth of field.

    Conclusions:

    • The developed system enables precise, direction-sensitive, subwavelength displacement measurements.
    • Interferometric optical-feedback laser systems are effective for high-resolution metrology.
    • Instrument performance aligns with theoretical expectations, validating the system's design.