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Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope
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Nanoplough-constrictions on thin YBCO films made with atomic force microscopy

A A O Elkaseh1, U Büttner, M Meincken

  • 1Department of Electrical and Electronic Engineering, Stellenbosch University, Stellenbosch 7600, South Africa.

Journal of Nanoscience and Nanotechnology
|November 21, 2007
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...