Related Experiment Video
Updated: Jul 10, 2026

11:33
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Ambient AFM nanoscale oxidation of hydrogen-passivated silicon with conductive-diamond-coated probes
Matthew J Schmitz1, C Reagan Kinser, Norma E Cortes
1Materials Science Department, Northwestern University, 2220 Campus Drive, Evanston, IL 60208-3108, USA.
Small (Weinheim an Der Bergstrasse, Germany)
|November 21, 2007
Abstract
No abstract available in PubMed .

