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Updated: Jul 8, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
1Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.
This study demonstrates electrothermal actuation of silicon microcantilevers using integrated heaters. The microcantilevers achieved significant out-of-plane motion, enabling nanoscale surface scanning.
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