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Updated: Jul 8, 2026

Scattering And Absorption of Light in Planetary Regoliths
Published on: July 1, 2019
Determination of surface profile statistics from electromagnetic scattering data
Abstract:
A new reverse Monte Carlo method for the determination of the surface profile statistics from differential reflection data for the scattering of electromagnetic radiation from rough surfaces is presented. The method is used to extract the power spectrum of the surface profile from scattering data recently measured by West and O'Donnell [J. Opt. Soc. Am. A 12, 390 (1995)]. Excellent agreement with the power spectrum of the surface profile measured by contact profilometry is obtained.
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