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Updated: Jul 8, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Location of the metal atoms in Ce2@C78 and its bis-silylated derivative
Michio Yamada1, Takatsugu Wakahara, Takahiro Tsuchiya
1Center for Tsukuba Advanced Research Alliance, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
Abstract:
Dimetallofullerene Ce(2)@C(78) and its bis-silylated derivative (1) were successfully prepared and fully characterized.
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