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Updated: Jul 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Development of an automated scanning monochromator for monitoring thin films

F J Van Milligen, B Bovard, M R Jacobson

    Applied Optics
    |June 15, 1985
    PubMed
    Abstract

    No abstract available in PubMed .

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