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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

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Acoustooptic figure of merit for single crystal germanium at 10.6-Mum wavelength

A J Fox

    Applied Optics
    |July 15, 1985
    PubMed
    Abstract

    No abstract available in PubMed .

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