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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Domain sensitive contrast in photoelectron emission microscopy

D Thien1, P Kury, M Horn-von Hoegen

  • 1Fachbereich Physik und CeNiDE, Universität Duisburg-Essen, Campus Duisburg, 47057, Duisburg, Germany. dagmar.thien@uni-due.de

Physical Review Letters
|February 1, 2008
PubMed

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