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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Characterization of the topography of vacuum-deposited films. 1: Light scattering

M J Verkerk, I J Raaijmakers

    Applied Optics
    |October 15, 1986
    PubMed
    Abstract

    No abstract available in PubMed .

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