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Updated: Jul 7, 2026
06:46
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
High sensitivity imaging Thomson scattering for low temperature plasma
H J van der Meiden1, R S Al, C J Barth
1FOM-Institute for Plasma Physics Rijnhuizen, Association EURATOM-FOM, partner in the Trilateral Euregio Cluster, P.O. Box 1207, 3430 BE Nieuwegein, The Netherlands.
The Review of Scientific Instruments
|February 6, 2008
Summary
A new imaging Thomson scattering system enhances low-temperature plasma diagnostics. This system achieves high spatial resolution for electron density and temperature measurements, crucial for plasma research.
Area of Science:
- Plasma Physics
- Diagnostic Techniques
Background:
- Low-temperature plasmas require precise diagnostic tools.
- Existing methods may lack the necessary sensitivity or spatial resolution.
Purpose of the Study:
- To develop a highly sensitive imaging Thomson scattering system.
- To enable accurate measurement of plasma parameters in low-temperature applications.
Main Methods:
- Utilized a neodymium-doped yttrium aluminum garnet laser (532 nm).
- Implemented a unique stray light suppression system.
- Employed a Littrow spectrometer with an intensified CCD camera and image intensifier.
Main Results:
- Achieved spatial resolution of 0.6 mm for a 30 mm plasma column.
- Demonstrated observational errors of 3% for electron density (n(e)) and 6% for electron temperature (T(e)).
- Stray light contribution below 9 x 10(17) m(-3) in electron density equivalents.
Conclusions:
- The developed system offers high sensitivity and spatial resolution for plasma diagnostics.
- Enables accurate electron density and temperature profiling in low-temperature plasmas.
- Single-shot measurements are feasible for high electron densities (n(e)>2 x 10(21) m(-3)).
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