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Reflection-wavelength control method for layer-by-layer controlled x-ray multilayer mirrors.

M Ishii, S Iwai, T Ueki

    Applied Optics
    |April 1, 1997
    PubMed
    Summary

    A novel method controls X-ray multilayer mirror reflection wavelengths by adjusting layer ratios, enabling precise design for specific wavelengths without interface roughness. This advances X-ray optics development.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • X-ray Science

    Background:

    • X-ray multilayer mirrors are crucial for focusing and manipulating X-ray beams.
    • Achieving precise control over the reflection wavelength of these mirrors is essential for various applications.
    • Interface roughness in multilayer structures can degrade mirror performance.

    Purpose of the Study:

    • To propose a new method for controlling the reflection wavelength of X-ray multilayer mirrors.
    • To demonstrate a technique that minimizes interface roughness during fabrication.
    • To design multiperiodic X-ray mirrors for specific spectral lines.

    Main Methods:

    • Development of a layer-by-layer control method for fabricating X-ray multilayer mirrors.
    • Utilizing the combination ratio of periodic layers to determine the reflection wavelength.

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  • Designing multiperiodic mirrors with specific layer structures.
  • Main Results:

    • A method for controlling reflection wavelength without interface roughness was successfully proposed.
    • The reflection wavelength was found to be simply determined by the combination ratio of periodic layers.
    • Multiperiodic X-ray mirrors were designed with target reflectance wavelengths of 3.374 nm (C VI 1s-2p) and 3.950 nm (Ca XVIII 3d-5f).

    Conclusions:

    • The proposed layer-by-layer control method offers precise wavelength tunability for X-ray multilayer mirrors.
    • The combination ratio of layers is a simple yet effective parameter for dictating mirror reflectance wavelengths.
    • This technique facilitates the development of advanced X-ray optical components for scientific research.