Updated: Jul 7, 2026

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
A novel method controls X-ray multilayer mirror reflection wavelengths by adjusting layer ratios, enabling precise design for specific wavelengths without interface roughness. This advances X-ray optics development.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: