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The limit of detection (LOD) is the smallest amount of analyte that can be distinguished from the background noise. The LOD value corresponds to the concentration at which the analyte signal is three times larger than the standard deviation of the blank signal. Below this value, the analyte signal cannot be differentiated from the background noise. It is calculated by dividing the calibration slope by 3 times the standard deviation of the blank signals.
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Detection limits of an internal-reflection sensor for the optical beam deflection method.

A García-Valenzuela, R Diaz-Uribe

|July 1, 1997

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The internal reflection method offers comparable or better sensitivity and resolution for angle deflection measurements compared to bicell detectors, especially under typical lab conditions. This technique shows promise for developing compact optical beam deflection sensors.

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Implementation of a Reference Interferometer for Nanodetection

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Published on: April 26, 2014

Area of Science:

Optics
Sensor Technology
Metrology

Background:

Optical beam deflection is a sensitive measurement technique.
Bicell position-sensitive detectors are commonly used for angle deflection measurements.
Internal reflection methods offer an alternative approach.

Purpose of the Study:

To theoretically determine the detection limit of the quasi-critical internal-reflection method for angle deflection measurements.
To compare its performance with the bicell detector method.
To explore its potential for compact sensor development.

Main Methods:

Theoretical calculation of detection limits.
Derivation of formulas for sensitivity and resolution under shot noise limitation.
Comparison of internal reflection and bicell detector methods.

Main Results:

The quasi-critical internal-reflection method's theoretical detection limit was calculated.
Formulas for shot noise limited sensitivity and resolution were derived.
Internal reflection method shows potential for better sensitivity and resolution than bicell detectors under typical laboratory constraints.

Conclusions:

The internal reflection method is a viable alternative to bicell detectors for angle deflection measurements.
It offers advantages in sensitivity and resolution under specific conditions.
This method can be utilized for developing compact optical beam deflection sensors.