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Relation between Poisson's ratio, Modulus of Elasticity and Modulus of Rigidity01:15

Relation between Poisson's ratio, Modulus of Elasticity and Modulus of Rigidity

Deformation occurs in axial and transverse directions when an axial load is applied to a slender bar. This deformation impacts the cubic element within the bar, transforming it into either a rectangular parallelepiped or a rhombus, contingent on its orientation. This transformation process induces shearing strain. Axial loading elicits both shearing and normal strains. Applying an axial load instigates equal normal and shearing stresses on elements oriented at a 45° angle to the load axis.

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Related Experiment Video

Updated: Jul 7, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

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Published on: January 26, 2016

Two-modulator generalized ellipsometry: theory.

G E Jellison, F A Modine

    Applied Optics
    |February 12, 2008
    PubMed
    Summary

    A novel ellipsometer design enables full Mueller matrix determination using two photoelastic modulator-polarizer pairs. This advanced optical technique accurately characterizes complex samples and dynamic processes like film growth.

    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Surface Science

    Background:

    • Ellipsometry is a powerful optical technique for characterizing thin films and surfaces.
    • Traditional ellipsometry methods can be limited in their ability to fully determine sample properties.
    • Mueller matrix ellipsometry provides more comprehensive information about anisotropic and depolarizing samples.

    Purpose of the Study:

    • To introduce a new ellipsometer design capable of measuring all elements of a sample's Mueller matrix.
    • To demonstrate the versatility of the new instrument for various material characterization applications.
    • To overcome limitations of existing ellipsometers in complex sample analysis.

    Main Methods:

    • The new ellipsometer utilizes two photoelastic modulator-polarizer pairs operating at different resonant frequencies.

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    Published on: August 13, 2019

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    Last Updated: Jul 7, 2026

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

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    Interfacial Molecular-level Structures of Polymers and Biomacromolecules Revealed via Sum Frequency Generation Vibrational Spectroscopy

    Published on: August 13, 2019

  • The time-dependent intensity of the light beam is analyzed to extract Mueller matrix elements.
  • Measurements are performed in a single configuration, with additional elements accessible by changing azimuthal angles.

    • Main Results:

    • All 16 elements of the sample Mueller matrix can be obtained through analysis of the complex intensity data.
    • Nine Mueller matrix elements are measurable in a single configuration.
    • The remaining seven elements are accessible by adjusting the azimuthal angles of the photoelastic modulators.

    Conclusions:

    • The developed ellipsometer provides a complete characterization of sample Mueller matrices.
    • This technique is sufficient for completely characterizing various real-world scenarios, including film growth, anisotropic materials, and depolarization.
    • The instrument offers enhanced capabilities for advanced optical metrology and materials analysis.