Related Experiment Video
Updated: Jul 7, 2026

Optical Trap Loading of Dielectric Microparticles In Air
Published on: February 5, 2017
Optical information storage and charge traps in PZT thin films
Abstract:
Storage of optical data in thin film PZT (lead zirconate titanate) has been demonstrated at a wavelength of 833 nm. A method for the storage and detection of simple optical-data images in thin PZT films is described. Dots and bars were stored in a 0.5-mum-thick 0/50/50 PZT using 488, 543, 633, and 833 nm wavelengths, and detected by measuring photocurrents while scanning a low-power read beam across the film. The data presented suggest that traps and related photoinduced charge carrier generation play an important role in this optical storage mechanism.
More Related Videos
10:27Fabrication of Nano-engineered Transparent Conducting Oxides by Pulsed Laser Deposition
Published on: February 27, 2013
08:18Synthesis and Characterization of High c-axis ZnO Thin Film by Plasma Enhanced Chemical Vapor Deposition System and its UV Photodetector Application
Published on: October 3, 2015
Related Concept Videos
P-N junction
The Electrical Double Layer