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UV–Vis Spectrometers

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...

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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

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Numerical algorithm for spectroscopic ellipsometry of thick transparent films.

S Bosch, J Pérez, A Canillas

|February 13, 2008

Summary

This study introduces a numerical method for analyzing thick transparent films using spectroscopic ellipsometry. The technique accurately determines film thickness and refractive index by fitting optical coefficients.

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Last Updated: Jul 7, 2026

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Area of Science:

Materials Science
Optical Physics
Spectroscopy

Background:

Spectroscopic ellipsometry is a powerful technique for characterizing thin films.
Accurate determination of optical properties for thick transparent films remains challenging.

Purpose of the Study:

To develop a numerical method for spectroscopic ellipsometry of thick transparent films.
To accurately determine both the thickness and refractive index dispersion of such films.

Main Methods:

Assumed an analytical expression for the refractive index dispersion with unknown coefficients.
Fitted coefficients at a fixed thickness, then varied thickness within a range.
Identified the best-fit thickness and derived refractive index from coefficients at that thickness.

Main Results:

Successfully implemented a numerical method for spectroscopic ellipsometry.
The method provides accurate determination of film thickness.
Refractive index dispersion is accurately defined by the obtained coefficients.

Conclusions:

The developed numerical method is effective for analyzing thick transparent films.
This approach offers a reliable way to determine optical properties.
The method optimizes the fitting process to yield precise thickness and refractive index values.