Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A new laser Doppler system for examining optic nerve head circulation.

Journal of biomedical optics·2012
Same author

Vibration-resistant phase-shifting interferometry.

Applied optics·2010
Same author

Modal approximation for the electromagnetic field of a near-field optical probe.

Applied optics·2010
Same author

Numerical simulations of vibration in phase-shifting interferometry.

Applied optics·2010
Same author

High-speed noncontact profiler based on scanning white-light interferometry.

Applied optics·2010
Same author

Extending the unambiguous range of two-color interferometers.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jul 7, 2026

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
11:57

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)

Published on: December 1, 2016

Interferometric back focal plane microellipsometry.

G D Feke, D P Snow, R D Grober

    Applied Optics
    |February 15, 2008
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel ellipsometric technique for high-resolution material analysis. The method enables precise local refractive index measurements, improving topographic data accuracy for diverse samples.

    More Related Videos

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
    10:21

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

    Published on: July 26, 2016

    Related Experiment Videos

    Last Updated: Jul 7, 2026

    Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
    11:57

    Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)

    Published on: December 1, 2016

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
    10:21

    Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces

    Published on: July 26, 2016

    Area of Science:

    • Optical Physics
    • Materials Science
    • Nanotechnology

    Background:

    • Ellipsometry is crucial for material characterization, but high lateral resolution remains a challenge.
    • Accurate measurement of optical properties like refractive index is essential for understanding material behavior.
    • Interferometric topography can be affected by material heterogeneity, necessitating correction methods.

    Purpose of the Study:

    • To develop a high-lateral-resolution ellipsometric analysis technique.
    • To enable local measurement of material refractive indices.
    • To provide a method for correcting interferometric topography measurements.

    Main Methods:

    • Utilized a Michelson-type phase-shifting interferometer for back focal plane phase distribution measurement.
    • Performed local measurements of the ellipsometric parameter delta across a spectrum of incidence angles.
    • Inverted Fresnel reflection equations to derive refractive index from measurable phase change and reflectivity.

    Main Results:

    • Demonstrated a linear proportionality between delta and the phase change on reflection for normally incident light.
    • Successfully derived expressions for the real and imaginary parts of the refractive index.
    • Achieved local measurements of sample refractive indices with the developed apparatus.

    Conclusions:

    • The presented technique offers high lateral resolution for ellipsometric analysis.
    • Local refractive index determination is feasible, enhancing material characterization capabilities.
    • Correction of interferometric topography for heterogeneous specimens is possible by determining the phase change on reflection.